The book begins with an introduction to software reliability, models and techniques. The book is an informative book covering the strategies needed to assess software failure behaviour and its quality, as well as the application of optimization tools for major managerial decisions related to the software development process. It features a broad range of topics including software reliability assessment and apportionment, optimal allocation and selection decisions and upgradations problems.
It moves through a variety of problems related to the evolving field of optimization of software reliability engineering, including software release time, resource allocating, budget planning and warranty models, which are each explored in depth in dedicated chapters.
This book provides a comprehensive insight into present-day practices in software reliability engineering, making it relevant to students, researchers, academics and practising consultants and engineers.
Table of Content
Introduction to Software Reliability, Models and Techniques.- Software Reliability Assessment and Allocation.- Software Release Time Problems.- Optimal Testing Resource Allocation.- Component Selection Problem for COTS Software.- Software Development Budget Planning.- Multi-Release Software Systems.- Software Warranty Models.- Path Models for Software Reliability Assessment.- Green Software Development Process.- Software Vulnerability Analysis.
About the author
Dr. Anu G Aggarwal is Professor in Department of Operational Research, University of Delhi with more than 20 years of teaching and Research Experience. She is an active researcher with more than 150 research publications in International peer reviewed journals, books chapters and International & National conference proceedings. She has guided more than 20 MPhil and 5 Ph D students; served as Technical chair, Co-chair for a number of International Conferences; undertaken a number of Research Projects funded by Govt. Agencies; Delivered invited talks at International Conferences and served as Resource Person at Faculty Development Programs. She has been awarded the Young Researcher Award for Applications of Soft Computing Techniques in Software Reliability awarded at 4th International Conference on Quality, Reliability and Infocom Technology (Trends and Future Directions) in 2009. Her key research interests include Reliability Growth modelling for Software systems and applications of Soft Computing Techniques; mathematical modelling and optimization in Consumer Buying Behaviour, Innovation-Diffusion modelling; Multi-Criteria decision making techniques.Abhishek Tandon received his Ph.D. degree in Software Reliability and Marketing from the Department of Operational Research, University of Delhi. He is currently working as Senior Assistant Professor in Shaheed Sukhdev College of Business Studies, University of Delhi. He has served as Deputy Director (Research) in the Indian Council of Social Science Research (ICSSR), Delhi, India. He has published papers in the field of reliability modelling, optimization theory, forecasting and marketing research. He was awarded the Meritorious Teacher Award by the Government of NCT of Delhi for the year 2016-17. He is Life Member of the Society for Reliability Engineering, Quality and Operations Management (SREQOM).
Hoang Pham is Distinguished Professor and former Chairman (2007-2013) of the Department of Industrial and Systems Engineering at Rutgers University. He has served as Editor-in-Chief, Editor, Associate Editor and Board Member of many journals. He is Editor of Springer Book Series in Reliability Engineering and has served as Conference Chair and Programme Chair of over 40 international conferences and workshops. Dr. Pham is Author or Co-author of 7 books, has published over 200 journal articles and 100 conference papers, and edited 15 books including Springer Handbook in Engineering Statistics and Handbook in Reliability Engineering. Dr. Pham has delivered over 40 invited keynote and plenary speeches at many international conferences. His numerous awards include the 2009 IEEE Reliability Society Engineer of the Year Award. Dr. Pham is Fellow of the IEEE and IISE.
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