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Sudeb Dasgupta & Anirban Sengupta 
VLSI Design and Test 
23rd International Symposium, VDAT 2019, Indore, India, July 4-6, 2019, Revised Selected Papers

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का आवरण Sudeb Dasgupta & Anirban Sengupta: VLSI Design and Test (ePUB)
This book constitutes the refereed proceedings of the 23st International Symposium on VLSI Design and Test, VDAT 2019, held in Indore, India, in July 2019. The 63 full papers were carefully reviewed and selected from 199 submissions. The papers are organized in topical sections named: analog and mixed signal design; computing architecture and security; hardware design and optimization; low power VLSI and memory design; device modelling; and hardware implementation.
€111.67
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भाषा अंग्रेज़ी ● स्वरूप EPUB ● ISBN 9789813297678 ● संपादक Sudeb Dasgupta & Anirban Sengupta ● प्रकाशक Springer Singapore ● प्रकाशित 2019 ● डाउनलोड करने योग्य 3 बार ● मुद्रा EUR ● आईडी 7279693 ● कॉपी सुरक्षा Adobe DRM
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