Logic circuits are becoming increasingly susceptible to probabilistic behavior caused by external radiation and process variation. In addition, inherently probabilistic quantum- and nano-technologies are on the horizon as we approach the limits of CMOS scaling. Ensuring the reliability of such circuits despite the probabilistic behavior is a key challenge in IC design—one that necessitates a fundamental, probabilistic reformulation of synthesis and testing techniques. This monograph will present techniques for analyzing, designing, and testing logic circuits with probabilistic behavior.
Tabella dei contenuti
Introduction.- Probabilistic Transfer Matrices.- Computing with Probabilistic Transfer Matrices.- Testing Logic Circuits for Probabilistic Faults.- Signtaure-based Reliability Analysis.- Design for Robustness.- Summary and Extensions.
Lingua Inglese ● Formato PDF ● Pagine 124 ● ISBN 9789048196449 ● Dimensione 5.0 MB ● Casa editrice Springer Netherland ● Città Dordrecht ● Paese NL ● Pubblicato 2012 ● Scaricabile 24 mesi ● Moneta EUR ● ID 2666612 ● Protezione dalla copia DRM sociale