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David Hunt & Long Nguyen 
Patent Searching 
Tools & Techniques

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Обкладинка David Hunt & Long Nguyen: Patent Searching (PDF)
Whether you’re a patent examiner, patent attorney, commercial patent searcher, patent liaison, IP librarian, law professor, or competitive intelligence analyst, you’ll find Patent Searching: Tools and Techniques to be just the guide you have been waiting for, with a range of approaches to patent searching that will be useful to you regardless of your technical expertise or role in the intellectual property community.
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Зміст

About the Editors.

About Landon IP, Inc.

Acknowledgments.

Preface.

Chapter 1: Patent Law and Examination as Context for Patent
Searching.

The U.S. Patent System.

Look before You Leap: Considerations before Filing.

Patent Examination Process.

Backlog of Patent Applications.

Chapter 2: Types of Patent Searches.

Patentability.

Validity.

Infringement.

Clearance.

State of the Art.

Patent Landscape.

Benefits of Prior Art Searching.

Chapter 3: The Mechanics of Searching.

Introduction.

Properly Scoping the Search.

Conducting the Search.

Issues Peculiar to Certain Technical Disciplines.

Estimating Search Time.

Chapter 4: Patent Analysis.

The Precursor to Patent Analysis.

Searches versus Analyses: What’s the Difference?

Features of Patent Analyses and Reporting.

Sample Patent Analysis Report.

Chapter 5: Approaches to Reporting Search Results.

Purpose of the Search Report.

Anatomy of a Search Report.

Writing a Summary.

Presenting the Subject Matter.

Discussing References.

Writing Discussions.

Indicating Claims.

Prioritizing References.

Central References.

Peripheral References.

Central and Peripheral References.

Search History.

Classification Areas.

Databases Accessed.

Examiners Contacted.

Conclusion.

Chapter 6: Search Tools.

The Availability of Patent Information.

Criteria for Selecting Search Tools.

When to Select a Search Tool.

Data Sources for Chemical Searches.

Data Sources for Mechanical Searches.

Data Sources For Electrical/Computer Searches.

Data Sources for Business Methods Searches.

Methods of Access.

Text Search Syntax.

Discussion of Specific Search Tools.

Access to Nonpatent Literature.

Value-Added Capabilities of Search Tools.

Conclusion.

Index.

Про автора

David Hunt is the CEO and owner of Landon IP, Inc. He holds
a BA and an MBA from the College of William & Mary and has
worked as a senior manager in corporate strategy, market research,
and competitive intelligence at the Federal Home Loan Mortgage
Corporation (Freddie Mac) in Mc Lean, Virginia. Mr. Hunt has served
as a project manager at large and small companies in the
information technology areas. He has considerable experience in
operations management. Mr. Hunt is a member of PIUG and PATMG,
which are the professional patent information users groups in the
United States and England. He is a member of the International
Trademark Association (INTA) as well as the Society for Competitive
Intelligence Professionals (SCIP).

Long B. Nguyen is the director of patent search quality
for Landon IP, Inc. He holds an MS in engineering management from
George Washington University, and a BS in mechanical engineering
and a BA in economics from Syracuse University. Mr. Nguyen is a
registered patent agent (No. 56, 138) with several years of
experience in patent prosecution at the United States Patent and
Trademark Office (USPTO). While at the USPTO as a patent examiner,
he examined technologies that included traction devices, wheels and
axles, and tire inflation systems. Mr. Nguyen also has experience
in business methods.

Matthew Rodgers is the vice president of the Patent
Search Group for Landon IP, Inc. He holds a BS in mechanical
engineering from the University of Texas at Austin. Mr. Rodgers has
conducted research in semiconductor heat treatment and selective
laser sintering. Additionally, he possesses significant experience
in the analysis of metallurgical failure. Prior to joining Landon
IP, Mr. Rodgers worked for several years as a patent examiner at
the USPTO and as a technical specialist who conducted patent
searches at other commercial patent search firms. He is a regular
faculty member of the leading patent law training company, Patent
Resources Group, Inc., of Charlottesville, Virginia.
Мова Англійська ● Формат PDF ● Сторінки 208 ● ISBN 9780470116838 ● Розмір файлу 8.1 MB ● Редактор David Hunt & Long Nguyen ● Видавець John Wiley & Sons ● Опубліковано 2007 ● Видання 1 ● Завантажувані 24 місяців ● Валюта EUR ● Посвідчення особи 2313825 ● Захист від копіювання Adobe DRM
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