CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies covers a broad range of topics related to SRAM design and test. From SRAM operation basics through cell electrical and physical design to process-aware and economical approach to SRAM testing. The emphasis of the book is on challenges and solutions of stability testing as well as on development of understanding of the link between the process technology and SRAM circuit design in modern nano-scaled technologies.
€160.49
Table of Content
and Motivation.- SRAM Circuit Design and Operation.- SRAM Cell Stability: Definition, Modeling and Testing.- Traditional SRAM Fault Models and Test Practices.- Techniques for Detection of SRAM Cells with Stability Faults.- Soft Errors in SRAMs: Sources, Mechanisms and Mitigation Techniques.About the author
Prof. Sachdev has authored several successful books with Springer
Language English ● Format PDF ● Pages 194 ● ISBN 9781402083631 ● File size 6.9 MB ● Publisher Springer Netherland ● City Dordrecht ● Country NL ● Published 2008 ● Downloadable 24 months ● Currency EUR ● ID 2148709 ● Copy protection Social DRM
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