Emil Zolotoyabko 
Basic Concepts of X-Ray Diffraction 

Dieses Lehrbuch eines erfahrenen Universitätsdozenten gibt Antworten auf die Fragen, die Studierende wirklich stellen. Klare Illustrationen, eine klare Sprache und klar gegliederte, kurze Kapitel lassen keine Verständnisprobleme aufkommen.

Table of Content

Preface
Introduction

DIFFRACTION PHENOMENA IN OPTICS

WAVE PROPAGATION IN PERIODIC MEDIA

DYNAMICAL DIFFRACTION OF PARTICLES AND FIELDS: GENERAL CONSIDERATIONS
The Two-Beam Approximation
Diffraction Profile: The Laue Scattering Geometry
Diffraction Profile: The Bragg Scattering Geometry

DYNAMICAL X-RAY DIFFRACTION: THE EWALD-LAUE APPROACH
Dynamical X-Ray Diffraction: Two-Beam Approximation

DYNAMICAL DIFFRACTION: THE DARWIN APPROACH
Scattering by a Single Electron
Atomic Scattering Factor
Structure Factor
Scattering Amplitude from an Individual Atomic Plane
Diffraction Intensity inthe Bragg Scattering Geometry

DYNAMICAL DIFFRACTION IN NONHOMOGENEOUS MEDIA. THE TAKAGI-TAUPIN APPROACH
Takagi Equations
Taupin Equation

X-RAY ABSORPTION

DYNAMICAL DIFFRACTION IN SINGLE-SCATTERING APPROXIMATION: SIMULATION OF HIGH-RESOLUTION X-RAY DIFFRACTION IN HETEROSTRUCTURES AND MULTILAYERS
Direct Wave Summation Method

RECIPROCAL SPACE MAPPING AND STRAIN MEASUREMENTS IN HETEROSTRUCTURES

X-RAY DIFFRACTION IN KINEMATIC APPROXIMATION
X-Ray Polarization Factor
Debye-Waller Factor

X-RAY DIFFRACTION FROM POLYCRYSTALLINE MATERIALS
Ideal Mosaic Crystal
Powder Diffraction

APPLICATIONS TO MATERIALS SCIENCE: STRUCTURE ANALYSIS

APPLICATIONS TO MATERIALS SCIENCE: PHASE ANALYSIS
Internal Standard Method
Rietveld Refinement

APPLICATIONS TO MATERIALS SCIENCE: PREFERRED ORIENTATION (TEXTURE) ANALYSIS
The March-Dollase Approach

APPLICATIONS TO MATERIALS SCIENCE: LINE BROADENING ANALYSIS
Line Broadening due to Finite Crystallite Size
Line Broadening due to Microstrain Fluctuations
Williamson-Hall Method
The Convolution Approach
Instrumental Broadening
Relation between Grain Size-Induced and Microstrain-Induced Broadenings of X-Ray Diffraction Profiles

APPLICATIONS TO MATERIALS SCIENCE: RESIDUAL STRAIN/STRESS MEASUREMENTS
Strain Measurements in Single-Crystalline Systems
Residual Stress Measurements in Polycrystalline Materials

IMPACT OF LATTICE DEFECTS ON X-RAY DIFFRACTION

X-RAY DIFFRACTION MEASUREMENTS IN POLYCRYSTALS WITH HIGH SPATIAL RESOLUTION
The Theory of Energy-Variable Diffraction (EVD)

INELASTIC SCATTERING
Inelastic Neutron Scattering
Inelastic X-Ray Scattering

INTERACTION OF X-RAYS WITH ACOUSTIC WAVES
Thermal Diffuse Scattering
Coherent Scattering by Externally Excited Phonons

TIME-RESOLVED X-RAY DIFFRACTION

X-RAY SOURCES
Synchrotron Radiation

X-RAY FOCUSING OPTICS
X-Ray Focusing: Geometrical Optics Approach
X-Ray Focusing: Diffraction Optics Approach

X-RAY DIFFRACTOMETERS
High-Resolution Diffractometers
Powder Diffractometers

Index

About the author

Emil Zolotoyabko is Professor in the Department of Materials Science and Engineering at the Technion – Israel Institute of Technology (Haifa). He is holder of the Abraham Tulin Academic Chair and recipient of the 2001 Henry Taub Prize for Academic Excellence. Emil Zolotoyabko has authored more than 160 scientific publications, three books, and four chapters in books devoted to the development of new X-ray diffraction methods and their applications for studying the structure and dynamical characteristics of different materials systems.