Wayne B. Nelson 
Accelerated Testing 
Statistical Models, Test Plans, and Data Analysis

The Wiley-Interscience Paperback Series consists of selected books
that have been made more accessible to consumers in an effort to
increase global appeal and general circulation. With these new
unabridged softcover volumes, Wiley hopes to extend the lives of
these works by making them available to future generations of
statisticians, mathematicians, and scientists.

‘. . . a goldmine of knowledge on accelerated life testing
principles and practices . . . one of the very few capable of
advancing the science of reliability. It definitely belongs in
every bookshelf on engineering.’

-Dev G. Raheja, Quality and Reliability Engineering
International

‘. . . an impressive book. The width and number of topics
covered, the practical data sets included, the obvious knowledge
and understanding of the author and the extent of published
materials reviewed combine to ensure that this will be a book used
frequently.’

-Journal of the Royal Statistical Society

A benchmark text in the field, Accelerated Testing: Statistical
Models, Test Plans, and Data Analysis offers engineers, scientists,
and statisticians a reliable resource on the effective use of
accelerated life testing to measure and improve product
reliability. From simple data plots to advanced computer programs,
the text features a wealth of practical applications and a clear,
readable style that makes even complicated physical and statistical
concepts uniquely accessible. A detailed index adds to its value as
a reference source.

表中的内容

Preface.

1. Introduction and Background.

2. Models for Life Tests with Constant Stress.

3. Graphical Data Analysis.

4. Complete Data and Least Squares Analyses.

5. Censored Data and Maximum Likelihood Methods.

6. Test Plans.

7. Competing Failure Modes and Size Effect.

8. Least-Squares Comparisons for Complete Data.

9. Maximum Likelihood Comparisons for Censored and Other
Data.

10. Models and Data Analyses for Step and Varying Stress.

11. Accelerated Degradation.

Appendix A. Statistical Tables.

References.

Index.

关于作者

WAYNE B. NELSON, Ph D, is a leading expert on analysis of reliability and accelerated test data. Formerly with General Electric Research & Development for twenty-three years, he now privately consults on and teaches engineering applications of statistics for many companies, professional societies, and universities. For his outstanding contributions to reliability data analysis and accelerated testing, he was elected a Fellow of the Institute of Electrical and Electronics Engineers, the American Society for Quality, and the American Statistical Association.