Efficient Test Methodologies for High-Speed Serial Links describes in detail several new and promising techniques for cost-effectively testing high-speed interfaces with a high test coverage. One primary focus of Efficient Test Methodologies for High-Speed Serial Links is on efficient testing methods for jitter and bit-error-rate (BER), which are widely used for quantifying the quality of a communication system. Various analysis as well as experimental results are presented to demonstrate the validity of the presented techniques.
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Table des matières
An Efficient Jitter Measurement Technique.- BER Estimation for Linear Clock and Data Recovery Circuit.- BER Estimation for Non-linear Clock and Data Recovery Circuit.- Gaps in Timing Margining Test.- An Accurate Jitter Estimation Technique.- A Two-Tone Test Method for Continuous-Time Adaptive Equalizers.- Conclusions.
Langue Anglais ● Format PDF ● Pages 98 ● ISBN 9789048134434 ● Taille du fichier 3.1 MB ● Maison d’édition Springer Netherland ● Lieu Dordrecht ● Pays NL ● Publié 2009 ● Téléchargeable 24 mois ● Devise EUR ● ID 2221076 ● Protection contre la copie DRM sociale
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