Efficient Test Methodologies for High-Speed Serial Links describes in detail several new and promising techniques for cost-effectively testing high-speed interfaces with a high test coverage. One primary focus of Efficient Test Methodologies for High-Speed Serial Links is on efficient testing methods for jitter and bit-error-rate (BER), which are widely used for quantifying the quality of a communication system. Various analysis as well as experimental results are presented to demonstrate the validity of the presented techniques.
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Tabella dei contenuti
An Efficient Jitter Measurement Technique.- BER Estimation for Linear Clock and Data Recovery Circuit.- BER Estimation for Non-linear Clock and Data Recovery Circuit.- Gaps in Timing Margining Test.- An Accurate Jitter Estimation Technique.- A Two-Tone Test Method for Continuous-Time Adaptive Equalizers.- Conclusions.
Lingua Inglese ● Formato PDF ● Pagine 98 ● ISBN 9789048134434 ● Dimensione 3.1 MB ● Casa editrice Springer Netherland ● Città Dordrecht ● Paese NL ● Pubblicato 2009 ● Scaricabile 24 mesi ● Moneta EUR ● ID 2221076 ● Protezione dalla copia DRM sociale
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